南京大學亞原子電鏡研究實驗室王鵬教授招2017年入學博士研究生

南京大學材料系王鵬教授南京大學亞原子電鏡研究實驗室誠征碩士、博士研究生，目前研究實驗室擁有先進的兩臺高分辨透射電鏡及其它與電鏡相關的設備，具有良好的科研條件。真誠歡迎熱愛科研、對工作積極認真、有材料、物理、化學、光學等相關背景的同學加入我們的團隊，并希望在碩博期間有所建樹。待遇按照南京大學統一政策執行，并根據表現給予補助。 7]~65@%R-&  
有意報考者請發郵件至：wangpeng@nju.edu.cn 9)a:8/
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1.低維納米材料及材料界面的原子分辨率的表征；（具有低維功能納米材料的制備等背景優先） 9*+%Qt,{B  
2.超高分辨電子成像技術開發及其應用；（具有傅里葉光學，物理光學，Matlab編程的背景優先） nSL x1Q  
3.先進球差校正顯微表征、原位動態觀測及EELS譜學的應用；（具有材料、物理、化學的背景） xi]qdiA  
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	王鵬
	教授
	辦公室地址：	鼓樓校區科學樓1102；仙林校區亞原子分辨電鏡室（天文樓后）
	辦公室電話：	025-89681519
	Email：  wangpeng@nju.edu.cn

個人主頁： [url]https://www.researchgate.net/profile/Peng_Wang134[/url]

實驗室主頁：

研究方向：

1.低維納米材料及材料界面的原子分辨率的表征； 2.三維成像電鏡技術及其應用 3.先進球差校正顯微技術及其應用

開設課程：

先進透射電子顯微學

個人簡介：

王鵬，首批國家青年千人計劃入選者，現為南京大學現代工程與應用科學學院教授。本科畢業于哈爾濱工業大學，碩士畢業于韓國慶北大學，隨后赴英國利物浦大學從事超高分辨率電子顯微透射鏡在材料表征上的應用及研究，2006年獲得博士學位。先后在英國國家超高分辨率電子顯微鏡實驗室SuperSTEM和牛津大學材料系電子顯微鏡組作博士后研究。 迄今已在國際權威學術雜志發表論文三十余篇，其中作為第一作者發表SCI論文10篇（《物理評論快報》兩篇，《Ultramicroscopy》兩篇），合作在《自然》子篇等上發表兩篇文章。） 在國際學術會議上口頭大會報告十三次，其中兩次特邀。2011 年被英國皇家物理學院（Institute of Physics）選入正式會員(MInstP)。目前在南京大學負責亞原子分辨率透射電子顯微鏡實驗室的運行及科研管理工作。（2012年購進兩臺高分辨透射電子顯微鏡，包括一臺具有雙球差校正器及單色儀的掃描透射電子顯微鏡）。 研究專長為利用球差校正的掃描透射電子顯微鏡成像技術和電子能量損失能譜來研究材料原子尺度上的結構以及性能，成功的研究確定了量子點，石墨烯，納米線等一系列新型納米材料的二維和三維結構。獨立開發的掃描共聚焦電子成像技術首次突破了三維立體圖像在層析方向上小于10納米并有化學選擇性的層析度。近兩年的研究方向主要側重于開發新的電子成像技術來實現新型納米結構和原子級結構的三維重建以及決定其化學成分在三維結構中的分布。

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文章:

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D’Alfonso, A.V. Martin, A.J. Morgan, P. Wang, H. Sawada, A.I. Kirkland, L.J. Allen, Generalized Fourier Holography Meets Coherent Diffractive Imaging, Microscopy Today, 23 (2015) 28-33. ?d*0-mhQ,   [10] X. Chang, S. Wang, Q. Qi, M.A. Gondal, S.G. Rashid, D. Yang, M.A. Dastageer, K. Shen, Q. Xu, P. Wang, Constrained growth of ultrasmall BiOCl nanodiscs with a low percentage of exposed {001} facets and their enhanced photoreactivity under visible light irradiation, Applied Catalysis B: Environmental, 176-177 (2015) 201-211. qYHAXc}$   [11] X. Chang, S. Wang, Q. Qi, M.A. Gondal, S.G. Rashid, S. Gao, D. Yang, K. Shen, Q. Xu, P. Wang, Insights into the growth of bismuth nanoparticles on 2D structured BiOCl photocatalysts: an in situ TEM investigation, Dalton Trans, (2015). kMGK8y   [12] L. Xie, P. Wang, X.Q. Pan, A perturbation theory study of electron vortices in electromagnetic fields: the case of infinitely long line charge and magnetic dipole, Micron, 63 (2014) 9-14. *RQkL'tRf   [13] L.L. Fan, S. Chen, Z.L. Luo, Q.H. Liu, Y.F. Wu, L. Song, D.X. Ji, P. Wang, W.S. Chu, C. Gao, C.W. Zou, Z.Y. Wu, Strain dynamics of ultrathin VO(2) film grown on TiO(2) (001) and the associated phase transition modulation, Nano Lett, 14 (2014) 4036-4043. Im;8Abf   [14] A.J. D'Alfonso, A.J. Morgan, A.W.C. Yan, P. Wang, H. Sawada, A.I. Kirkland, L.J. Allen, Deterministic electron ptychography at atomic resolution, Physical Review B, 89 (2014). D{&0r.2F   [15] J. Benson, Q. Xu, P. Wang, Y. Shen, L. Sun, T. Wang, M. Li, P. Papakonstantinou, Tuning the catalytic activity of graphene nanosheets for oxygen reduction reaction via size and thickness reduction, ACS Appl Mater Interfaces, 6 (2014) 19726-19736. c$)Y$@D   [16] P. Wang, A.J. D'Alfonso, A. Hashimoto, A.J. Morgan, M. Takeguchi, K. Mitsuishi, M. Shimojo, A.I. Kirkland, L.J. Allen, P.D. Nellist, Contrast in atomically resolved EF-SCEM imaging, Ultramicroscopy, 134 (2013) 185-192. =#@eD m%   [17] A. Shmeliov, J.S. Kim, K.B. Borisenko, P. Wang, E. Okunishi, M. Shannon, A.I. Kirkland, P.D. Nellist, V. Nicolosi, Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets, Nanoscale, 5 (2013) 2290-2294. (o/HLmr@Y   [18] A.J. Morgan, A.J. D’Alfonso, P. Wang, H. Sawada, A.I. Kirkland, L.J. Allen, Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution, Physical Review B, 87 (2013). !%' 1x2?   [19] X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, P. Wang, P.D. Nellist, A.I. Kirkland, M. Tezuka, M. Shimojo, Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy, J Electron Microsc (Tokyo), 61 (2012) 159-169. EK^B=)q6:W   [20] P. Wang, A.I. Kirkland, P.D. Nellist, A.J. D’Alfonso, A.J. Morgan, L.J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope, Microscopy and Microanalysis, 18 (2012) 532-533. b_&;i4[   [21] P. Wang, A.I. Kirkland, P.D. Nellist, Chromatic Confocal Electron Microscopy with a Finite Pinhole Size, Journal of Physics: Conference Series, 371 (2012) 012002. q c}r.'p   [22] P. Wang, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Y. Zhu, M. Okuda, A.I. Kirkland, P.D. Nellist, Three-dimensional elemental mapping of hollow Fe2O3@SiO2 mesoporous spheres using scanning confocal electron microscopy, Applied Physics Letters, 100 (2012) 213117. SMr ]Gf.   [23] A. Shmeliov, M. Shannon, P. Wang, P.D. Nellist, V. Nicolosi, Imaging and diffraction characterisation of 2D inorganic nanostructures, Journal of Physics: Conference Series, 371 (2012) 012071. N;XaK+_2F   [24] G. Ruben, P. Wang, A.J. D'Alfonso, P.D. Nellist, L.J. Allen, Nanohalos: a manifestation of electron channelling in gold nanoparticles, Ultramicroscopy, 120 (2012) 10-15. -e"~UDq`   [25] P.D. Nellist, P. Wang, Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope, Annual Review of Materials Research, 42 (2012) 125-143. D-7PO3F:F   [26] L. Jones, P. Wang, P.D. Nellist, Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM), Journal of Physics: Conference Series, 371 (2012) 012003. 6&o9mc\I   [27] A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, P.D. Nellist, A.I. Kirkland, M. Takeguchi, Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy, Applied Physics Letters, 101 (2012) 253108. o2 =UUD&   [28] P. Wang, G. Behan, A.I. Kirkland, P.D. Nellist, E.C. Cosgriff, A.J. D'Alfonso, A.J. Morgan, L.J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope, Ultramicroscopy, 111 (2011) 877-886. wD}ojA&DU   [29] G. Mountjoy, D. Loche, P. Wang, K. Sader, A. Corrias, Scanning Transmission Electron Microscopy Study of the Evolution of Needle-Like Nanostructures in CoFe2O4and NiFe2O4Silica Nanocomposite Aerogels, The Journal of Physical Chemistry C, 115 (2011) 5358-5365. `C~RA,M   [30] P. Wang, G. Behan, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo, A.I. Kirkland, P.D. Nellist, Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope, Physical Review Letters, 104 (2010). ?dJ-g~   [31] P. Wang, G. Behan, A.I. Kirkland, P.D. Nellist, Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope, Journal of Physics: Conference Series, 241 (2010) 012012. gC81ICM   [32] M. Takeguchi, M. Okuda, A. Hashimoto, K. Mitsuishi, M. Shimojo, X. Zhang, P. Wang, P.D. Nellist, A.I. Kirkland, Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy, Microscopy and Microanalysis, 16 (2010) 1836-1837. <MgR x9   [33] K. Sader, B. Schaffer, G. Vaughan, P. Wang, A.L. Bleloch, R. Brydson, A. Brown, Smart Acquisition EELS, Journal of Physics: Conference Series, 241 (2010) 012010. RbUhLcG5   [34] P.D. Nellist, P. Wang, G. Behan, A.I. Kirkland, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. Cosgriff, A.J. D'Alfonso, L.J. Allen, S.D. Findlay, Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy, Microscopy and Microanalysis, 16 (2010) 1834-1835. E5d?toZ,8"   [35] A.R. Lupini, P. Wang, P.D. Nellist, A.I. Kirkland, S.J. Pennycook, Aberration measurement using the Ronchigram contrast transfer function, Ultramicroscopy, 110 (2010) 891-898. 60KhwD1   [36] A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A.I. Kirkland, P.D. Nellist, M. Takeguchi, Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope, Microscopy and Microanalysis, 16 (2010) 1888-1889. FgIL亚洲国产精品va在线观看麻豆